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PARTICLES ON SURFACES: DETECTION: ADHESION, AND REMOVAL By K L Mittal
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大約HK$ 505.64
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運送：
US $3.99（大約 HK$ 31.04） USPS Media MailTM.
所在地：Portland, Oregon, 美國
送達日期：
估計於 9月18日 (星期四)至 9月22日 (星期一)之間送達 運送地點 94104
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eBay 物品編號：145134748061
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- 物品狀況
- 很新: 狀況完好的書籍。封面發亮且沒有損壞，精裝本書籍含書皮。不存在缺頁或內頁受損，無褶皺或破損，同時也沒有對文字標注/標記，或在留白處書寫內容。內封面上標記極少。書籍的磨損和破損程度也很低。 查看所有物品狀況定義會在新視窗或分頁中開啟
- Book Title
- Particles on Surfaces: Detection: Adhesion, and Removal
- ISBN-10
- 0824795350
- ISBN
- 9780824795351
關於產品
Product Identifiers
Publisher
CRC Press LLC
ISBN-10
0824795350
ISBN-13
9780824795351
eBay Product ID (ePID)
309447
Product Key Features
Number of Pages
440 Pages
Language
English
Publication Name
Particles on Surfaces : Detection: Adhesion, and Removal
Subject
Materials Science / General, Materials Science / Thin Films, Surfaces & Interfaces, Chemistry / Physical & Theoretical, Chemistry / General
Publication Year
1994
Type
Textbook
Subject Area
Technology & Engineering, Science
Format
Hardcover
Dimensions
Item Height
0.9 in
Item Weight
34.3 Oz
Item Length
9.3 in
Item Width
5.9 in
Additional Product Features
Intended Audience
Scholarly & Professional
Dewey Edition
22
Illustrated
Yes
Dewey Decimal
620/.44
Table Of Content
Particles on surfaces - adhesion induced deformations; surface force tensile interactions between micrometer size particles and a polyester-PDMS block copolymer substrate; polymer to particle adhesion probed with atomic force microscopy; surface particle contamination identification in microelectronics; an overview of spacecraft particulate contamination phenomena; contamination on optical surfaces-concerns, prevention, detection, and removal; an advanced surface particle and molecular contaminant identification, removal, and collection system; the role of air ionization in reducing surface contamination by particles in the cleanroom; selecting a contamination-free deburring process - testing abrasive blasting media; particle generation and control in tubing and piping connection design; detection and identification of particles on silicon surfaces; the characterization of particles on spacecraft returned from orbit; a light-scattering method for determining the composition of particles on surfaces; light scattering by spherical particles on planar multi-layered substrates; new test procedure for the examination of the particulate cleanliness of technical surfaces; discrimination between particulate and film type contamination on surfaces by means of total reflection X-ray fluorescence spectrometry; particle characterization on surfaces by Auger electron spectroscopy; interrogating the behavior of micrometer-sized particles on surfaces with focused acoustic waves; removal of glass particles from glass surfaces - a review; particle removal characteristics of surface cleaning methods involving sonication and/or spray impingement; fluid dynamics of liquid jets used for particle removal from surfaces; enhanced particle removal from inertial guidance instrument parts by fluorocarbon surfactant solutions; laser cleaning techniques for the removal of small surface particulates.
Synopsis
This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.
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