Principles of CMOS VLSI Design A Systems Perspective 2nd Ed Hardcover Book 1993

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Book Title
Principles of CMOS VLSI Design : A Systems Perspective Hardcover
ISBN
9780201533767
類別

關於產品

Product Identifiers

Publisher
Benjamin-Cummings Publishing Company
ISBN-10
0201533766
ISBN-13
9780201533767
eBay Product ID (ePID)
54617

Product Key Features

Number of Pages
608 Pages
Publication Name
Principles of Cmos Vlsi Design : a Systems Perspective
Language
English
Subject
Electronics / Semiconductors, Electronics / Circuits / Vlsi & Ulsi
Publication Year
1993
Type
Textbook
Author
Neil H. Weste, Karman Eshragian
Subject Area
Technology & Engineering
Series
Vlsi Systems Ser.
Format
Hardcover

Dimensions

Item Height
1.3 in
Item Weight
46 Oz
Item Length
9.5 in
Item Width
7.6 in

Additional Product Features

Edition Number
2
Intended Audience
College Audience
LCCN
92-016564
Dewey Edition
22
Illustrated
Yes
Dewey Decimal
621.395
Table Of Content
Introduction to CMOS Circuits. Introduction. MOS Transistors. MOS Transistor Switches. CMOS Logic. Circuit Representations. CMOS Summary. MOS Transistor Theory. Introduction. MOS Device Design Equation. The Complemenatry CMOS Inverter-DC Characteristics. Alternate CMOS Inverters. The Differential Stage. The Transmission Gate. Bipolar Devices. CMOS Processing Technology. Silicon Semiconductor Technology: An Overview. CMOS Technologies. Layout Design Rules. CAD Issues. Circuit Characterization and Performance Estimation. Introduction. Resistance Estimation. Capacitance Estimation. Inductance. Switching Characteristics. CMOS Gate Transistor Sizing. Power Consumption. Determination of Conductor Size. Charge Sharing. Design Margining. Yield. Scaling of MOS Transistor Dimensions. CMOS Circuit and Logic Design. Introduction. CMOS Logic Structures. Basic Physical Design of Simple Logic Gates. Clocking Strategies. Physical and Electrical Design of Logic Gates. 10 Structures. Structured Design Strategies. Introduction. Design Economics. Design Strategies. Design Methods. CMOS Chip Design Options. Design Capture Tools. Design Verification Tools. CMOS Test Methodolgies. Introduction. Fault Models. Design for Testability. Automatic Test Pattern Generation. Design for Manufacturability. CMOS Subsystem Design. Introduction. Adders and Related Functions. Binary Counters. Multipliers and Filter Structures. Random Access and Serial Memory. Datapaths. FIR and IIR Filters. Finite State Machines. Programmable Logic Arrays. Random Control Logic.
Synopsis
With this revision, Weste conveys an understanding of CMOS technology, circuit design, layout, and system design sufficient to the designer. The book deals with the technology down to the layout level of detail, thereby providing a bridge from a circuit to a form that may be fabricated. The early chapters provide a circuit view of the CMOS IC design, the middle chapters cover a sub-system view of CMOS VLSI, and the final section illustrates these techniques using a real-world case study., technology, circuit design, layout, and system design sufficient to feel confident with the technology. The book deals the technology down to the layout level of detail, thereby providing a bridge from a circuit to a form that may be fabricated. The early chapters provide a circuit view of the CMOS IC design, the middle chapters cover a sub-system view of CMOS VLSI, and the final section illustrates these techniques through the use of a case study. This capstone section ties together the preceding chapters and gives the student a feel for real-world design. Features Updates all the technology sections to sub-micron CMOS, technology that has played an increasingly important part in the integrated circuit industry. Emphasizes semi-custom and other design approaches. Expands the subsystem section to include more building blocks. Provides an introductory section to familiarize the reader with the terminology and some important building blocks. Covers performance estimation in detail. Features New to this Edition Addresses the growing need designers to produce a VLSI product correctly and within a specified time frame and budget. Expanded section on testing.
LC Classification Number
TK7874.W46 1993

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