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Microwave Library: Distortion in RF Power Amplifiers by Timo Rahkonen and...

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ISBN
9781580535397
Series
Microwave Library
Publication Year
2003
Type
Textbook
Format
Hardcover
Language
English
Publication Name
Distortion in RF Power Amplifiers
Author
Joel Vuolevi, Timo Rahkonen
Publisher
Artech House
Item Weight
20 Oz
Number of Pages
272 Pages

關於產品

Product Information

A treatment of distortion in RF power amplifiers. It seeks to offer guidance on designing easily linearizable systems that have low memory effects. The reader is offered a detailed understanding of how the matching impedances of a power amplifier and other RF circuits can be tuned to minimize overall distortion. It also demonstrates how to build models that can be used for distortion simulations.

Product Identifiers

Publisher
Artech House
ISBN-10
1580535399
ISBN-13
9781580535397
eBay Product ID (ePID)
2440498

Product Key Features

Author
Joel Vuolevi, Timo Rahkonen
Publication Name
Distortion in RF Power Amplifiers
Format
Hardcover
Language
English
Series
Microwave Library
Publication Year
2003
Type
Textbook
Number of Pages
272 Pages

Dimensions

Item Weight
20 Oz

Additional Product Features

Lc Classification Number
Tk7871.58.P6v79 2003
Table of Content
Introduction - Historical Perspective. The Approach. Main Contents of the Book. Outline of the Book. Some Circuit Theory and Terminology -- Classification of Electrical Systems. Analyzing Linear Systems. Memoryless Spectral Regeneration. Signal Bandwidth Dependent Nonlinear Effects. Analysis of Nonlinear Systems. Memory Effects in RF Power Amplifiers - Efficiency. Linearization. Electrical Memory Effects. Thermal Memory Effects. Amplitude Domain Effects. The Volterra Model - Nonlinear Simulation Models. The BJT/HBT Model. Calculating IM3 Responses. MESFET Model and Analysis. Simulating and Measuring Memory Effects - Simulating Memory Effects. Measuring the Memory Effects. Memory Effects and Linearisation. Cancellation of Memory Effects - Envelope Filtering. Impedance Optimization. Envelope Injection. Characterization of the Volterra Model - Calibration. Pulsed S-parameter Measurements. De-embed the Effects of the Package. Calculation of Small-Signal Parameters. Fitting Polynomial Models. Extracted Nonlinearity Coefficient of a MESFET. Extracted Nonlinearity Coefficient of a 30W LDMOS. DC Characterization. Appendix A: Volterra Analysis in More Detail. Appendix B: IM3 Equations for Cascaded 2nd-Order Distortion Mechanisms. Appendix C: The Truncation Error.
Copyright Date
2003
Target Audience
Scholarly & Professional
Topic
Electronics / General, Microwaves
Lccn
2002-043669
Dewey Decimal
621.384/12
Dewey Edition
21
Illustrated
Yes
Genre
Technology & Engineering

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