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Learning from VLSI Design Experience by Weng Fook Lee (English) Hardcover Book

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ISBN-13
9783030032371
Type
NA
Publication Name
NA
ISBN
9783030032371
Publication Year
2019
Format
Hardcover
Language
English
Book Title
Learning from Vlsi Design Experience
Author
Weng Fook Lee
Item Length
9.3in
Publisher
Springer International Publishing A&G
Genre
Technology & Engineering, Computers
Topic
Systems Architecture / General, Electronics / Circuits / General, Electronics / General
Item Width
6.1in
Item Weight
18.9 Oz
Number of Pages
Xxix, 214 Pages

關於產品

Product Information

This book shares with readers practical design knowledge gained from the author's 24 years of IC design experience. The author addresses issues and challenges faced commonly by IC designers, along with solutions and workarounds. Guidelines are described for tackling issues such as clock domain crossing, using lockup latch to cross clock domains during scan shift, implementation of scan chains across power domain, optimization methods to improve timing, how standard cell libraries can aid in synthesis optimization, BKM (best known method) for RTL coding, test compression, memory BIST, usage of signed Verilog for design requiring +ve and -ve calculations, state machine, code coverage and much more. Numerous figures and examples are provided to aid the reader in understanding the issues and their workarounds.

Product Identifiers

Publisher
Springer International Publishing A&G
ISBN-10
303003237x
ISBN-13
9783030032371
eBay Product ID (ePID)
10038516685

Product Key Features

Book Title
Learning from Vlsi Design Experience
Author
Weng Fook Lee
Format
Hardcover
Language
English
Topic
Systems Architecture / General, Electronics / Circuits / General, Electronics / General
Publication Year
2019
Genre
Technology & Engineering, Computers
Number of Pages
Xxix, 214 Pages

Dimensions

Item Length
9.3in
Item Width
6.1in
Item Weight
18.9 Oz

Additional Product Features

Number of Volumes
1 Vol.
Lc Classification Number
Tk7867-7867.5
Copyright Date
2019
Illustrated
Yes

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