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Steven H. Voldman ESD Testing (Hardback) (US IMPORT)
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- Book Title
- ESD Testing
- Title
- ESD Testing
- Subtitle
- From Components to Systems
- EAN
- 9780470511916
- ISBN
- 9780470511916
- Genre
- Technology & Engineering
- Release Year
- 2016
- Release Date
- 02/12/2016
- Country/Region of Manufacture
- US
- Item Length
- 172mm
- Publication Year
- 2016
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Publication Name
- Esd Testing: from Components to Systems
- Item Height
- 252mm
- Publisher
- John Wiley & Sons Inc
- Item Width
- 172mm
- Subject
- Physics
- Item Weight
- 652g
- Number of Pages
- 328 Pages
關於產品
Product Information
With the evolution of semiconductor technology and global diversification of the semiconductor business, testing of semiconductor devices to systems for electrostatic discharge (ESD) and electrical overstress (EOS) has increased in importance. ESD Testing: From Components to Systems updates the reader in the new tests, test models, and techniques in the characterization of semiconductor components for ESD, EOS, and latchup. Key features: Provides understanding and knowledge of ESD models and specifications including human body model (HBM), machine model (MM), charged device model (CDM), charged board model (CBM), cable discharge events (CDE), human metal model (HMM), IEC 61000-4-2 and IEC 61000-4-5. Discusses new testing methodologies such as transmission line pulse (TLP), to very fast transmission line pulse (VF-TLP), and future methods of long pulse TLP, to ultra-fast TLP (UF-TLP). Describes both conventional testing and new testing techniques for both chip and system level evaluation. Addresses EOS testing, electromagnetic compatibility (EMC) scanning, to current reconstruction methods. Discusses latchup characterization and testing methodologies for evaluation of semiconductor technology to product testing. ESD Testing: From Components to Systems is part of the authors' series of books on electrostatic discharge (ESD) protection; this book will be an invaluable reference for the professional semiconductor chip and system-level ESD and EOS test engineer. Semiconductor device and process development, circuit designers, quality, reliability and failure analysis engineers will also find it an essential reference. In addition, its academic treatment will appeal to both senior and graduate students with interests in semiconductor process, device physics, semiconductor testing and experimental work.
Product Identifiers
Publisher
John Wiley & Sons Inc
ISBN-13
9780470511916
eBay Product ID (ePID)
228790907
Product Key Features
Publication Name
Esd Testing: from Components to Systems
Format
Hardcover
Language
English
Subject
Physics
Publication Year
2016
Type
Textbook
Number of Pages
328 Pages
Dimensions
Item Height
252mm
Item Width
172mm
Item Weight
652g
Additional Product Features
Country/Region of Manufacture
United States
賣家提供的物品說明
商業賣家資料
增值稅識別編號：
- GB 864 1548 11
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物品所在地：
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